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Synchrotron X-Ray Microbeam Diffraction Measurements of Full Elastic Long Range Internal Strain and Stress Tensors in Commercial-Purity Aluminum Processed by Multiple Passes of Equal-Channel Angular Pressing

Published

Author(s)

Thien Q. Phan, Lyle E. Levine, I-Fang Lee, Jonathan Z. Tischler, Ruqing Xu, Yi Huang, Terrance G. Langdon, Michael E. Kassner

Abstract

Synchrotron X-ray microbeam diffraction was used to measure the full elastic long range internal strain and stress tensors of low dislocation density regions within the submicrometer grain/subgrain structure of equal-channel angular pressed (ECAP) AA1050 after 1, 2, and 8 passes. This is the first time that full tensors were measured in plastically deformed metals at this length scale. This work supplements previous studies that measured long range internal stresses (LRIS) in ECAP AA1050 of multiple passes, but only for a single direction. The maximum (most tensile or least compressive) principal elastic strain directions for the unloaded 1 pass sample for the grain/subgrain interiors align well with the pressing direction, and are more random for the 2 and 8 pass samples. The measurements reported here indicate that the local stresses and strains become increasingly isotropic (homogenized) with increasing ECAP passes using route BC. The average maximum (in magnitude) LRISs are -0.43 σa for 1 pass, -0.44 σa for 2 pass, and 0.14 σa for the 8 pass sample. These LRISs appear to be larger than LRISs reported by previous works (using single reflection measurements).
Citation
ACTA Materialia
Issue
112

Keywords

Long-range internal stress, Equal Channel Angular Pressing, Synchrotron Microbeam X-ray Diffraction, Full Strain Tensor

Citation

Phan, T. , Levine, L. , Lee, I. , Z., J. , Xu, R. , Huang, Y. , Langdon, T. and Kassner, M. (2016), Synchrotron X-Ray Microbeam Diffraction Measurements of Full Elastic Long Range Internal Strain and Stress Tensors in Commercial-Purity Aluminum Processed by Multiple Passes of Equal-Channel Angular Pressing, ACTA Materialia, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=919790 (Accessed May 23, 2024)

Issues

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Created April 23, 2016, Updated April 15, 2020