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Synchrotron Based Surface Science to Probe Structure and Chemistry of Polymeric Interfacial Regions

Published

Author(s)

Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, Daniel A. Fischer

Abstract

Synchrotron based X-ray absorption spectroscopy was utilized to probe the chemistry and structure of polymers in interfacial regions, including the interfacial composition of filled epoxy composites, and the surface orientation of polymer films. Polymer interfacial properties can be very different than their bulk properties1. Variations in chemical composition, molecular orientation, mobility, crystallinity, microstructure, etc are potential causes of these interfacial property changes in polymeric systems. The interfacial properties of polymers play a critical role in many generally applicable materials systems uses including adhesives, encapsulants, foams, filled polymers, thin polymer films and coatings, etc. To understand and control reliability and aging issues associated with polymer interfaces it is important to understand on a fundamental level what controls the properties, structure, and composition of polymers near the interface. In order to understand these interfacial phenomena, it is critical to have measurement technology capable of assessing polymer interfacial properties.
Proceedings Title
ACS Reprints: American Chemical Society Meeting | 2006| ACS
Conference Dates
September 1, 2006
Conference Location
Undefined
Conference Title
ACS

Keywords

interfaces, NEXAFS, polymers, surfaces

Citation

Lenhart, J. and Fischer, D. (2021), Synchrotron Based Surface Science to Probe Structure and Chemistry of Polymeric Interfacial Regions, ACS Reprints: American Chemical Society Meeting | 2006| ACS, Undefined (Accessed May 17, 2022)
Created October 12, 2021