Doderer, T.
, Hoffmann, D.
, Huebener, R.
, Kirchmann, N.
, Krulle, C.
, Lachenmann, S.
, Quenter, D.
, Schmidt, J.
, Stehle, S.
, Niemeyer, J.
, Popel, R.
, Benz, S.
and Booi, P.
(1993),
SUSAN (SUperconducting Systems ANalysis) by Low Temperature Scanning Electron Microscopy (LTSEM), IEEE Transactions on Applied Superconductivity
(Accessed December 2, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
SUSAN (SUperconducting Systems ANalysis) by Low Temperature Scanning Electron Microscopy (LTSEM)
Published
Author(s)
T. Doderer, D. Hoffmann, R. P. Huebener, N. Kirchmann, C. A. Krulle, S. G. Lachenmann, D. Quenter, J. Schmidt, S. Stehle, Juergen Niemeyer, R. Popel, , P. A. Booi
Citation
IEEE Transactions on Applied Superconductivity
Volume
3
Issue
1
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created February 28, 1993, Updated October 12, 2021