Doderer, T.
, Hoffmann, D.
, Huebener, R.
, Kirchmann, N.
, Krulle, C.
, Lachenmann, S.
, Quenter, D.
, Schmidt, J.
, Stehle, S.
, Niemeyer, J.
, Popel, R.
, Benz, S.
and Booi, P.
(1993),
SUSAN (SUperconducting Systems ANalysis) by Low Temperature Scanning Electron Microscopy (LTSEM), IEEE Transactions on Applied Superconductivity
(Accessed April 18, 2024)
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SUSAN (SUperconducting Systems ANalysis) by Low Temperature Scanning Electron Microscopy (LTSEM)
Published
Author(s)
T. Doderer, D. Hoffmann, R. P. Huebener, N. Kirchmann, C. A. Krulle, S. G. Lachenmann, D. Quenter, J. Schmidt, S. Stehle, Juergen Niemeyer, R. Popel, , P. A. Booi
Citation
IEEE Transactions on Applied Superconductivity
Volume
3
Issue
1
Pub Type
Journals
Citation
Created February 28, 1993, Updated October 12, 2021