Krupka, J.
, Derzakowski, K.
, Abramowicz, A.
, Baker-Jarvis, J.
, Ono, R.
and Geyer, R.
(2002),
Surface Impedance of Thin High Temperature Superconducting Films with a Sapphire Dielectric Resonator, 14th International Conference on Microwaves, Radar and Wireless Communications - MIKON-2002, Gdansk, 1, PL
(Accessed April 18, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Surface Impedance of Thin High Temperature Superconducting Films with a Sapphire Dielectric Resonator
Published
Author(s)
Jerzy Krupka, Kristof Derzakowski, A. Abramowicz, , ,
Abstract
The dielectric resonator technique is frequently used for surface resistance measurements of superconducting films. Generally, an effective surface resistance has been measured that neglects the finite thickness of superconducting films. The dependence of the surface impedance of superconducting films whose thickness is comparable to the London penetration depth is presented.Conference Dates
May 20-22, 2002
Conference Location
Gdansk, 1, PL
Conference Title
14th International Conference on Microwaves, Radar and Wireless Communications - MIKON-2002
Pub Type
Conferences
Keywords
dielectric resonator, London penetration depth, microwave superconductor, surface impedance, thin film
Citation
Created May 19, 2002, Updated October 12, 2021