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Surface Impedance of Thin High Temperature Superconducting Films with a Sapphire Dielectric Resonator

Published

Author(s)

Jerzy Krupka, Kristof Derzakowski, A. Abramowicz, James R. Baker-Jarvis, Ronald H. Ono, Richard G. Geyer

Abstract

The dielectric resonator technique is frequently used for surface resistance measurements of superconducting films. Generally, an effective surface resistance has been measured that neglects the finite thickness of superconducting films. The dependence of the surface impedance of superconducting films whose thickness is comparable to the London penetration depth is presented.
Conference Dates
May 20-22, 2002
Conference Location
Gdansk, 1, PL
Conference Title
14th International Conference on Microwaves, Radar and Wireless Communications - MIKON-2002

Keywords

dielectric resonator, London penetration depth, microwave superconductor, surface impedance, thin film

Citation

Krupka, J. , Derzakowski, K. , Abramowicz, A. , Baker-Jarvis, J. , Ono, R. and Geyer, R. (2002), Surface Impedance of Thin High Temperature Superconducting Films with a Sapphire Dielectric Resonator, 14th International Conference on Microwaves, Radar and Wireless Communications - MIKON-2002, Gdansk, 1, PL (Accessed April 17, 2024)
Created May 19, 2002, Updated October 12, 2021