Grievenkamp, J.
and Young, M.
(1989),
Surface Characterization and Testing II, Proc., SPIE, Surface Characterization and Testing II, , San Diego, CA, USA
(Accessed May 9, 2025)
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Surface Characterization and Testing II
Published
Author(s)
J. E. Grievenkamp, M. Young
Proceedings Title
Proc., SPIE, Surface Characterization and Testing II,
Volume
1164
Conference Dates
August 10-11, 1989
Conference Location
San Diego, CA, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1988, Updated October 12, 2021