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PUBLICATIONS

Surface Analysis of Interfacial Properties for Thin Film and Bulk YBa2Cu3O7

Published

Author(s)

Ronald H. Ono, James A. Beall, John (Jack) W. Ekin, A. J. Nelson, L. L. Kazmerski, A. R. Mason, A. B. Swartzlander, R. McConnell
Proceedings Title
Proc., Second Conf. on Superconductivity and Applications
Conference Dates
April 18-20, 2088
Conference Location
Buffalo, NY, USA
Pub Type
Conferences
Sensors

Citation

Ono, R. , Beall, J. , Ekin, J. , Nelson, A. , Kazmerski, L. , Mason, A. , Swartzlander, A. and McConnell, R. (1988), Surface Analysis of Interfacial Properties for Thin Film and Bulk YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub>, Proc., Second Conf. on Superconductivity and Applications, Buffalo, NY, USA (Accessed March 17, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 30, 1988, Updated October 12, 2021