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Surface Analysis of Interfacial Properties for Thin Film and Bulk YBa2Cu3O7

Published

Author(s)

Ronald H. Ono, James A. Beall, John (Jack) W. Ekin, A. J. Nelson, L. L. Kazmerski, A. R. Mason, A. B. Swartzlander, R. McConnell
Proceedings Title
Proc., Second Conf. on Superconductivity and Applications
Conference Dates
April 18-20, 2088
Conference Location
Buffalo, NY, USA

Citation

Ono, R. , Beall, J. , Ekin, J. , Nelson, A. , Kazmerski, L. , Mason, A. , Swartzlander, A. and McConnell, R. (1988), Surface Analysis of Interfacial Properties for Thin Film and Bulk YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub>, Proc., Second Conf. on Superconductivity and Applications, Buffalo, NY, USA (Accessed March 3, 2024)
Created December 30, 1988, Updated October 12, 2021