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PUBLICATIONS

Summary of the Panel Discussion on Opportunities and Needs

Published

Author(s)

Cedric J. Powell

Abstract

At the NIST Workshop on Modeling Electron Transport for Applications in Electron and X-ray Analysis and Metrology, there was a final panel discussion on opportunities and needs in this area. A summary is given of points made by some of the contributors in this session.
Citation
Surface and Interface Analysis
Volume
37
Issue
No. 11
Pub Type
Journals

Keywords

electron transport, modeling, nanotechnology, needs, opportunities, secondary-electron microscopy, simulation, surface analysis, X-ray analysis

Citation

Powell, C. (2005), Summary of the Panel Discussion on Opportunities and Needs, Surface and Interface Analysis (Accessed December 9, 2023)

Created November 1, 2005, Updated February 17, 2017