Powell, C.
(2005),
Summary of the Panel Discussion on Opportunities and Needs, Surface and Interface Analysis
(Accessed May 16, 2024)
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Summary of the Panel Discussion on Opportunities and Needs
Published
Author(s)
Abstract
At the NIST Workshop on Modeling Electron Transport for Applications in Electron and X-ray Analysis and Metrology, there was a final panel discussion on opportunities and needs in this area. A summary is given of points made by some of the contributors in this session.Citation
Surface and Interface Analysis
Volume
37
Issue
No. 11
Pub Type
Journals
Keywords
electron transport, modeling, nanotechnology, needs, opportunities, secondary-electron microscopy, simulation, surface analysis, X-ray analysis
Citation
Issues
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Created November 1, 2005, Updated February 17, 2017