Powell, C.
(2005),
Summary of the Panel Discussion on Opportunities and Needs, Surface and Interface Analysis
(Accessed March 20, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Summary of the Panel Discussion on Opportunities and Needs
Published
Author(s)
Abstract
At the NIST Workshop on Modeling Electron Transport for Applications in Electron and X-ray Analysis and Metrology, there was a final panel discussion on opportunities and needs in this area. A summary is given of points made by some of the contributors in this session.Citation
Surface and Interface Analysis
Volume
37
Issue
No. 11
Pub Type
Journals
Keywords
electron transport, modeling, nanotechnology, needs, opportunities, secondary-electron microscopy, simulation, surface analysis, X-ray analysis
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created November 1, 2005, Updated February 17, 2017