Summary of Latent Fingerprint work at NIST

Published

November 20, 2006

Author(s)

Vladimir N. Dvornychenko, Michael D. Garris

Abstract

This paper describes past and present fingerprint activity at NIST. While the primary focus is on latent fingerprints, the paper also surveys relevant general biometrics activity. The central focus of the paper is on the Latent Testing Workshop, held on the NIST Campus April 5-6, and the lessons that were learned from it. The primary goal of the workshop was to gather information for the creation of a "Latent Grand Challenge," whose purpose is to stimulate AFIS vendors to submit their prototype Latent AFIS systems for evaluation. To lay the foundations for such testing it is necessary that: 1) suitable test sets be identified and prepared; 2) the Application interface Program (AIP) be defined; and 3) the optimal method of performance scoring be defined .

Citation

NIST Interagency/Internal Report (NISTIR) - 7377

Report Number

7377

NIST Pub Series

NIST Interagency/Internal Report (NISTIR)

Pub Type

NIST Pubs

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Keywords

biometrics, fingerprint image quality measures, fingerprints, latent fingerprints, Latent Workshop, latents, lights-out systems

Citation

Dvornychenko, V. and Garris, M. (2006), Summary of Latent Fingerprint work at NIST, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50876 (Accessed April 23, 2024)