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Summary of ISO/TC 201 Standard: XXIX. ISO 20903: 2006 - Surface Chemical Analysis - Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy - Methods Used to Determine Peak Intensities and Information Required When Reporting Results

Published

Author(s)

Cedric J. Powell

Abstract

This article is a brief summary of ISO Standard 20903. This standard provides information on methods for the measurement of peak intensities in Auger electron and X-ray photoelectron spectra and on uncertainties of derived peak area. It also specifies the necessary information required in a report of analytical results based on such measurements.
Citation
Surface and Interface Analysis

Keywords

Auger electron spectroscopy, international standard, IOS, peak intensities, X-ray photoelectron spectroscopy

Citation

Powell, C. (2008), Summary of ISO/TC 201 Standard: XXIX. ISO 20903: 2006 - Surface Chemical Analysis - Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy - Methods Used to Determine Peak Intensities and Information Required When Reporting Results, Surface and Interface Analysis (Accessed April 21, 2024)
Created October 16, 2008