Powell, C.
(2008),
Summary of ISO/TC 201 Standard: XXIX. ISO 20903: 2006 - Surface Chemical Analysis - Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy - Methods Used to Determine Peak Intensities and Information Required When Reporting Results, Surface and Interface Analysis
(Accessed December 12, 2024)
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Summary of ISO/TC 201 Standard: XXIX. ISO 20903: 2006 - Surface Chemical Analysis - Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy - Methods Used to Determine Peak Intensities and Information Required When Reporting Results
Published
Author(s)
Abstract
This article is a brief summary of ISO Standard 20903. This standard provides information on methods for the measurement of peak intensities in Auger electron and X-ray photoelectron spectra and on uncertainties of derived peak area. It also specifies the necessary information required in a report of analytical results based on such measurements.Citation
Surface and Interface Analysis
Pub Type
Journals
Keywords
Auger electron spectroscopy, international standard, IOS, peak intensities, X-ray photoelectron spectroscopy
Citation
Issues
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Created October 16, 2008