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Substrate-dependent interface composition and charge transport in films for organic photovoltaics

Published

Author(s)

David Germack, Calvin Chan, Behrang Hamadani, Lee J. Richter, Daniel A. Fischer, David J. Gundlach, Dean DeLongchamp

Abstract

The buried interface composition of polymer-fullerene blends is found by near edge X ray absorption fine structure (NEXAFS) spectroscopy to depend on the surface energy of the substrate upon which they are cast. The interface composition determines the type of charge transport measured with thin film transistors. These results have implications for organic photovolatics device design and the use of transistors to evaluate bulk mobility in blends.
Citation
Applied Physics Letters
Issue
94

Keywords

photovoltaic, heterojunction, polythiophene, fullerene, nexafs, solar cell

Citation

Germack, D. , Chan, C. , Hamadani, B. , Richter, L. , Fischer, D. , Gundlach, D. and DeLongchamp, D. (2009), Substrate-dependent interface composition and charge transport in films for organic photovoltaics, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902284 (Accessed February 26, 2024)
Created June 8, 2009, Updated October 12, 2021