Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Studies of Operational Measurement of ROC Curve on Large Fingerprint Data Sets Using Two-Sample Bootstrap

Published

Author(s)

Jin Chu Wu

Abstract

From the operational perspective, for large-size fingerprint data, a receiver operating characteristic (ROC) curve is usually measured by the true accept rate (TAR) of the genuine scores given a specified false accept rate (FAR) of the impostor scores. The ties of genuine and/or impostor scores at a threshold can often occur for large-size fingerprint data, and how to determine the TAR at an operational FAR is provided. The accuracy of the measurement of TAR at a specified FAR for an ROC curve is explored using the nonparametric two-sample bootstrap. The variability of the estimates of standard error and lower bound and upper bound of 95% confidence interval of two-sample bootstrap distribution of the statistic TARs for large-size fingerprint data is extensively studied empirically. Thereafter, the number of two-sample bootstrap replications is determined. Both high-accuracy and low-accuracy fingerprint-image matching algorithms are taken as examples.
Citation
NIST Interagency/Internal Report (NISTIR) - 7449
Report Number
7449

Keywords

Confidence interval, Fingerprint matching, Nonparametric two-sample bootstrap, Receiver operating characteristic (ROC) Curve, Standard errors, Variability

Citation

, J. (2007), Studies of Operational Measurement of ROC Curve on Large Fingerprint Data Sets Using Two-Sample Bootstrap, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.7449 (Accessed December 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 4, 2007, Updated November 10, 2018