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Structure and Order in Organic Semiconductors

Published

Author(s)

Chad R. Snyder, Dean M. DeLongchamp, Ryan C. Nieuwendaal, Andrew A. Herzing

Abstract

Several techniques for characterizing semiconducting polymer order on different length scales are presented, including (1) differential scanning calorimetry (DSC), (2) solid state nuclear magnetic resonance spectroscopy (NMR), (3) transmission electron microscopy (TEM), and (4) grazing incidence scattering. Since the behaviour of highly conjugated polymers can differ distinctly from the more classic, highly saturated polymers for which these techniques were originally developed, e.g., polyethylene, the hazards and pitfalls associated with applying these techniques to semiconducting polymers will be discussed where appropriate. It will be assumed that the reader is familiar with the techniques being discussed; however, references will be made to more fundamental introductions to the techniques as well.
Citation
Semiconducting Polymers: Controlled Synthesis and Microstructure
Publisher Info
Royal Society of Chemistry, Cambridge, -1

Keywords

semiconducting polymers, calorimetry, solid state nuclear magnetic resonance, electron microscopy, grazing incidence X-ray scattering

Citation

Snyder, C. , DeLongchamp, D. , Nieuwendaal, R. and Herzing, A. (2017), Structure and Order in Organic Semiconductors, Semiconducting Polymers: Controlled Synthesis and Microstructure, Royal Society of Chemistry, Cambridge, -1 (Accessed February 23, 2024)
Created January 17, 2017, Updated March 21, 2017