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Structural, Electronic, and Dielectric Properties of Ultrathin Zirconia Films on Silicon

Published

Author(s)

Safak Sayan, Nhan Van Nguyen, James R. Ehrstein, Tom Emge, Eric Garfunkel, Mark Croft, Xinjian Zhou, David V. Vanderbilt, Igor Levin, Evgeni Gusev, Hyunjung G. Kim, P J. McIntyre
Citation
Applied Physics Letters
Volume
86

Citation

Sayan, S. , Nguyen, N. , Ehrstein, J. , Emge, T. , Garfunkel, E. , Croft, M. , Zhou, X. , Vanderbilt, D. , Levin, I. , Gusev, E. , Kim, H. and McIntyre, P. (2005), Structural, Electronic, and Dielectric Properties of Ultrathin Zirconia Films on Silicon, Applied Physics Letters (Accessed February 25, 2024)
Created March 31, 2005, Updated October 12, 2021