Sayan, S.
, Nguyen, N.
, Ehrstein, J.
, Emge, T.
, Garfunkel, E.
, Croft, M.
, Zhou, X.
, Vanderbilt, D.
, Levin, I.
, Gusev, E.
, Kim, H.
and McIntyre, P.
(2005),
Structural, Electronic, and Dielectric Properties of Ultrathin Zirconia Films on Silicon, Applied Physics Letters
(Accessed December 13, 2024)
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Structural, Electronic, and Dielectric Properties of Ultrathin Zirconia Films on Silicon
Published
Author(s)
, , , Tom Emge, Eric Garfunkel, Mark Croft, Xinjian Zhou, David V. Vanderbilt, , Evgeni Gusev, Hyunjung G. Kim, P J. McIntyre
Citation
Applied Physics Letters
Volume
86
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 31, 2005, Updated October 12, 2021