Strongly quadrature-dependent noise in superconducting microresonators measured at the vacuum-noise limit

Published

June 9, 2011

Author(s)

Jiansong Gao, Kent D. Irwin, Gene C. Hilton, John A. Mates, Daniel R. Schmidt, Leila R. Vale, Konrad W. Lehnert, Francois Mallet, Jonas Zmuidzinas

Abstract

We report noise measurement of superconducting micro-resonators with a Josephson parametric amplifier. These resonators show significant amount of frequency noise caused by surface two-level systems. However, in the dissipation quadrature, no excess noise is observed to our measurement sensitivity. These measurement constrains the noise in the dissipation quadrature to below the vacuum noise above 100 Hz. Our results have important implications for resonant readouts of various devices such as detectors and qubits.

Citation

Physical Review Letters

Volume

98

Issue

232508

Pub Type

Journals

Download Paper

DOI Link

Keywords

micro-resonator, kinetic inductance detector, two-level system, Josephson parametric amplifier, noise

Citation

Gao, J. , Irwin, K. , Hilton, G. , Mates, J. , Schmidt, D. , Vale, L. , Lehnert, K. , Mallet, F. and Zmuidzinas, J. (2011), Strongly quadrature-dependent noise in superconducting microresonators measured at the vacuum-noise limit, Physical Review Letters, [online], https://doi.org/10.1063/1.3597156 (Accessed October 27, 2025)