Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Stroboscopic Ultrafast Imaging Capabilities Using RF Strip-lines in a Commercial Transmission Electron Microscope



Spencer Reisbick, Myung-Geun Han, Chuhang Liu, yubin zhao, Eric Montgomery, Vikrant Gokhale, Jason J. Gorman, Chunguang Jing, June W. Lau, Yimei Zhu


The development of ultrafast electron microscopy (UEM), specifically stroboscopic imaging, has brought the study of structural dynamics to a new level by overcoming the spatial limitations of ultrafast spectroscopy and the temporal restrictions of traditional TEM simultaneously. Combining the concepts governing both techniques has enabled direct visualization of dynamics with spatiotemporal resolutions in the picosecond-nanometer regime. Here, we push the limits of imaging using a pulsed electron beam via RF induced transverse deflection based on the newly developed 200 keV frequency-tunable strip-line pulser. We demonstrate 0.2 nm spatial resolution at high magnifications and elucidation of Lorentz imaging using the phase-microscopy method. We also present beam coherence measurements and expand our study using the breathing modes of a silicon interdigitated comb under RF excitation which achieves improved temporal synchronization between the electron pulse-train and electric field. A new RF holder has also been developed with impedance matching to the RF signal to minimize transmission power loss to samples and its performance is compared with a conventional sample holder.


Ultrafast electron microscopy, electron pulser, frequency-tunable RF excitation, time-resolved stroboscopic imaging, coherent electron pulses.


Reisbick, S. , Han, M. , Liu, C. , zhao, Y. , Montgomery, E. , Gokhale, V. , Gorman, J. , Jing, C. , Lau, J. and Zhu, Y. (2022), Stroboscopic Ultrafast Imaging Capabilities Using RF Strip-lines in a Commercial Transmission Electron Microscope, Ultramicroscopy, [online],, (Accessed June 22, 2024)


If you have any questions about this publication or are having problems accessing it, please contact

Created May 1, 2022, Updated November 29, 2022