Strain Rate Effects in the Single Fiber Fragmentation Test for Fiber Matrix Adhesion

Published

August 1, 1999

Author(s)

Donald L. Hunston, Gale A. Holmes, R C. Peterson, Walter G. McDonough

Abstract

In this paper, precise measurements of fiber break regions formed during the single fiber fragmentation testing procedure have been made for E-glass/diglycidyl ether of bisphenol-A (DGEBA)/meta-phenylenediamine (m-PDA) single fiber fragmentation test (SFFT) specimens. From these measurements, the location and size of each fiber fragment was determined and the resulting information used to construct fragmentation maps of the tested fiber. By comparing these maps, the fragmentation process supports a random process. Since the interfacial shear strength (IFSS) or the interfacial shear stress transfer coefficient (I-STC) is obtained from the fragmentation data at saturation, frequency histograms of the E-glass/DGEBA/m-PDA saturated fragmentation data were constructed to determine the reproducibility of the fragmentation process. For the testing protocols used in this research, the E-glass/DGEBA/m-PDA frequency histograms of the fragment lengths were found to be generally reproducible. However, when the

Proceedings Title

American Chemical Society: Division of Polymeric Materials: Science and Engineering, Fall Meeting | | | American Chemical Society (ACS)

Volume

81

Conference Dates

August 1, 1999

Conference Location

Undefined

Conference Title

Polymeric Materials: Science and Engineering [Preprints]

Pub Type

Conferences

Download Paper

Local Download

Keywords

E-glass fibers, epoxy resin, fiber fragmentation, interface, interphase, nonlinear viscoelasticity, polyisocyanurate resin

Citation

Hunston, D. , Holmes, G. , Peterson, R. and McDonough, W. (1999), Strain Rate Effects in the Single Fiber Fragmentation Test for Fiber Matrix Adhesion, American Chemical Society: Division of Polymeric Materials: Science and Engineering, Fall Meeting | | | American Chemical Society (ACS), Undefined, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852834 (Accessed June 8, 2023)