Bassham, L.
, Rukhin, A.
, Soto, J.
, Nechvatal, J.
, Smid, M.
, Barker, E.
, Leigh, S.
, Levenson, M.
, Vangel, M.
, Banks, D.
, Heckert, N.
, Dray, J.
and Vo, S.
(2010),
A statistical test suite for random and pseudorandom number generators for cryptographic applications:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.800-22r1a
(Accessed June 4, 2023)