A Standard Illumination Source for the Evaluation of Display Measurement Methods and Instruments

Published

January 30, 2001

Author(s)

John M. Libert, Paul A. Boynton, Edward F. Kelley, Steven W. Brown, Yoshi Ohno, Farshid Manoocheri

Abstract

A prototype display measurement assessment transfer standard (DMATS) is being developed by the National Institute of Standards and Technology (NIST) to assist the display industry in standardizing measurement methods used to quantify and specify the performance of electronic displays. Designed as an idealized electronic display, the DMATS sources model photometric and colorimetric measurement problems commonly encountered in measuring electronic displays. NIST will calibrate DMATS units and distribute them to participating laboratories for measurement. Analysis of initial interlaboratory comparison results will provide a baseline assessment of display measurement uncertainties. Also, diagnostic indicators expected to emerge from the data will be used to assist laboratories in correcting deficiencies or in identifying metrology problem areas for further research, such as measurement techniques tailored to new display technologies. The paper describes the design and construction of a prototype DMATS source and preliminary photometric and colorimetric characterization. Also, the paper compares measurements obtained by several instruments under constant environmental conditions and examines the effects of veiling glare on chromaticity measurements.

Proceedings Title

Proc. Intl. Soc. for Optical Engineering (SPIE)

Volume

4297

Conference Dates

January 20-26, 2001

Conference Location

San Jose, CA, USA

Conference Title

SPIE - The International Society for Optical Engineering

Pub Type

Conferences

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Keywords

color measurement, display measurement, standards

Citation

Libert, J. , Boynton, P. , Kelley, E. , Brown, S. , Ohno, Y. and Manoocheri, F. (2001), A Standard Illumination Source for the Evaluation of Display Measurement Methods and Instruments, Proc. Intl. Soc. for Optical Engineering (SPIE), San Jose, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=8570 (Accessed April 25, 2024)