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Specular X-Ray Reflectivity and Small Angle Neutron Scattering for Structure Determination of Ordered Mesoporous Dielectric Films

Published

Author(s)

B D. Vogt, V. J. Lee, Wen-Li Wu, Yiping Liu
Citation
Journal of Physical Chemistry B
Volume
109

Keywords

Reflectivity, Scattering, Thin Films, reflectivity, small angle neutron scattering, thin films

Citation

Vogt, B. , Lee, V. , Wu, W. and Liu, Y. (2005), Specular X-Ray Reflectivity and Small Angle Neutron Scattering for Structure Determination of Ordered Mesoporous Dielectric Films, Journal of Physical Chemistry B, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853985 (Accessed April 21, 2024)
Created January 1, 2005, Updated February 17, 2017