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Spectroscopic Charge Pumping in the Presence of High Densities of Bulk Dielectric Traps

Published

Author(s)

Jason T. Ryan, Richard G. Southwick, Jason P. Campbell, Kin P. Cheung, Chadwin Young
Proceedings Title
Proceedings of the International reliability Physics Symposium
Conference Dates
April 15-19, 2012
Conference Location
Anaheim, CA
Conference Title
International reliability Physics Symposium

Citation

Ryan, J. , Southwick, R. , Campbell, J. , Cheung, K. and Young, C. (2012), Spectroscopic Charge Pumping in the Presence of High Densities of Bulk Dielectric Traps, Proceedings of the International reliability Physics Symposium, Anaheim, CA (Accessed August 8, 2022)
Created May 31, 2012, Updated February 19, 2017