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PUBLICATIONS

Specimen Biasing to Enhance or Suppress Secondary Electron Emission from Charging Specimens at Low Accelerating Voltages

Published

Author(s)

Michael T. Postek, William J. Keery, Robert D. Larrabee
Citation
Scanning Microscopy
Volume
11
Pub Type
Journals

Citation

Postek, M. , Keery, W. and Larrabee, R. (1989), Specimen Biasing to Enhance or Suppress Secondary Electron Emission from Charging Specimens at Low Accelerating Voltages, Scanning Microscopy (Accessed November 7, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 30, 1989, Updated October 12, 2021
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