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Specimen Biasing to Enhance or Suppress Secondary Electron Emission from Charging Specimens at Low Accelerating Voltages

Published

Author(s)

Michael T. Postek, William J. Keery, Robert D. Larrabee
Citation
Scanning Microscopy
Volume
11

Citation

Postek, M. , Keery, W. and Larrabee, R. (1989), Specimen Biasing to Enhance or Suppress Secondary Electron Emission from Charging Specimens at Low Accelerating Voltages, Scanning Microscopy (Accessed March 2, 2024)
Created December 30, 1989, Updated October 12, 2021