Specification-Driven Testing of Smart Card Interface Using a Formal Model

Published

April 30, 2007

Author(s)

Ramaswamy Chandramouli, Mark Blackburn

Abstract

Model-Driven Engineering (MDE) is emerging as a promising approach that uses models to support various phases of system development lifecycle such as Code Generation and Verification/Validation (V &V). In this paper, we describe the application of a model-driven process in the V &V phase for developing automated tests for testing the conformance of a smart card implementation to an interface specification. The smart card implementation under focus is the Personal Identity Verification (PIV) cards to be issued to the employees/contractors of the US government for physical access to government facilities and logical access to government IT systems. Our description of the model-driven conformance test generation application includes model development from specification and the subsequent use of the model for automated test generation, test execution and results analysis. We also illustrate the re-usability of model components for modeling related specifications as well as the extensibility of the model for testing smart card use case scenarios that involve invocation of sequence of commands to form a transaction.

Conference Location

, USA

Conference Title

IADIS International Conference on Applied Computing 2007

Pub Type

Conferences

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Keywords

automatic test generation, formal models, model reuse, Modeling, security properties, smart cards

Citation

Chandramouli, R. and Blackburn, M. (2007), Specification-Driven Testing of Smart Card Interface Using a Formal Model, IADIS International Conference on Applied Computing 2007, , USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=51146 (Accessed June 2, 2026)

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