TY  - CONF
AU  - Ramaswamy Chandramouli
AU  - Mark Blackburn
C2  - IADIS International Conference on Applied Computing 2007, , USA
DA  - 2007-04-30 00:04:00
LA  - en
PB  - IADIS International Conference on Applied Computing 2007, , USA
PY  - 2007
TI  - Specification-Driven Testing of Smart Card Interface Using a Formal Model
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=51146
ER  -