Sanders, A.
(1984),
Some Trends in Optical Electronic Metrology, Proc., Measurement Science Conference, Los Angeles, CA, USA
(Accessed December 10, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Some Trends in Optical Electronic Metrology
Published
Author(s)
A. A. Sanders
Proceedings Title
Proc., Measurement Science Conference
Issue
1
Conference Location
Los Angeles, CA, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1983, Updated October 12, 2021