Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

SNoW: Understanding the Causes of Strong, Neutral, and Weak Face Impostor Pairs

Published

Author(s)

P J. Phillips, Amanda Sgroi, Patrick J. Flynn, Kevin W. Bowyer

Abstract

The Strong, Neutral, or Weak Face Impostor Pairs problem was generated to explore the causes and impact of impostor face pairs that span varying strengths of nonmatch. We develop three partitions within the impostor distribution of a given algorithm. The Strong partition contains image pairs that are easy to categorize as nonmatches. The Neutral partition contains image pairs that are less easily categorized as nonmatches. The Weak partition contains image pairs that are likely to cause false matches. Three algorithms, and the fusion of their scores, were used to analyze the performance of these three partitions using the same set of match scores employed in the FRVT 2006 Challenge Dataset. The results of these experiments provide evidence that varying degrees of nonmatch scores impact the over- all performance and thus the impostor distribution deserves further exploration.
Conference Dates
September 30-October 2, 2013
Conference Location
Arlington, VA
Conference Title
The IEEE Sixth International Conference on Biometrics: Theory, Applications and Systems (BTAS 2013)

Citation

Phillips, P. , Sgroi, A. , Flynn, P. and Bowyer, K. (2013), SNoW: Understanding the Causes of Strong, Neutral, and Weak Face Impostor Pairs, The IEEE Sixth International Conference on Biometrics: Theory, Applications and Systems (BTAS 2013), Arlington, VA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914259 (Accessed October 12, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 27, 2013, Updated February 19, 2017