Smart Pyrometry for Combined Sample Temperature and Reflectance Measurements in Molecular-Beam Epitaxy
Kristine A. Bertness
We have fabricated spin-valve devices in a high-speed test structure that allows subnanosecond pulsed field excitation and high-bandwidth observation of the magnetoresistance response. The switching response varies for low-amplitude field pulses and approaches a consistent fast switch of less than 1 ns for field pulses of higher amplitude. For several pulse widths and amplitudes, the device switches into metastable states. The threshold amplitude fo the write-pulse was measured as a function of pulse duration for pulses as small as 250 ps in duration.
Journal of Vacuum Science and Technology B
crystal growth, emissivity, molecular beam epitaxy, pyrometry, semiconductors, temperature measurement
Smart Pyrometry for Combined Sample Temperature and Reflectance Measurements in Molecular-Beam Epitaxy, Journal of Vacuum Science and Technology B
(Accessed March 4, 2024)