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Small-Area Black Luminance Measurements on White Screen Using Replica Masks

Published

Author(s)

Paul A. Boynton, Edward F. Kelley

Abstract

Luminance measurements of small areas of black pixels on white-screen backgrounds are often used as metrics in display measurements, such as character-stroke contrasts or deep modulation transfer functions. Serious errors may be made in measurements and subsequent ergonomic conclusions if glare contributions of the measurement are not considered. We show a simple method for accounting for glare corruption of luminance measurements by using replica masks.
Proceedings Title
Small-Area Black Luminance Measurements on White Screen Using Replica Masks
Volume
29
Conference Dates
May 17-22, 1998
Conference Location
Anaheim, CA

Keywords

display measurements, lens flare, replica mask, small-area black measurements, veiling glare

Citation

Boynton, P. and Kelley, E. (1998), Small-Area Black Luminance Measurements on White Screen Using Replica Masks, Small-Area Black Luminance Measurements on White Screen Using Replica Masks, Anaheim, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=8470 (Accessed October 20, 2025)

Issues

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Created April 30, 1998, Updated October 12, 2021
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