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In Situ Measurements of Dislocation Structure Evolution During Plastic Deformation of Single-Crystal Aluminum

Published

Author(s)

Lyle E. Levine, Gabrielle G. Long, R M. Thomson

Abstract

Ultra-small-angle X-ray scattering data were obtained from single-crystal aluminum samples deformed in situ to strains up to 13%. The data are consistent with recent theoretical predictions, allowing quantitative microstructural parameters to be extracted. The experiments have probed positional correlations between dislocations, detected dislocation dipoles, examined the inhomogeneity of the micostructure, and demonstrated the evolution of dislocation structures during room temperature creep.
Citation
In Situ Measurements of Dislocation Structure Evolution During Plastic Deformation of Single-Crystal Aluminum

Keywords

dislocations, plastic deformation, small-angle scattering, work hardening

Citation

Levine, L. , Long, G. and Thomson, R. (2017), In Situ Measurements of Dislocation Structure Evolution During Plastic Deformation of Single-Crystal Aluminum, In Situ Measurements of Dislocation Structure Evolution During Plastic Deformation of Single-Crystal Aluminum (Accessed April 13, 2024)
Created February 19, 2017