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PUBLICATIONS

Simultaneous in operando monitoring of depth and absorptance in high power laser processing at 200 kHz

Published

Author(s)

Troy Allen, Brian Simonds, Jack R. Tanner, James Fraser
Proceedings Title
Proceedia CIRP
Volume
94
Conference Dates
September 6-10, 2020
Conference Location
Fuerth, DE
Conference Title
LANE 2020 - 11th CIRP Conference on Photonic Technologies
Pub Type
Conferences

Download Paper

https://doi.org/10.1016/j.procir.2020.09.157
Local Download
Process measurement and control, Metals, Manufacturing and Additive manufacturing

Citation

Allen, T. , Simonds, B. , Tanner, J. and Fraser, J. (2020), Simultaneous in operando monitoring of depth and absorptance in high power laser processing at 200 kHz, Proceedia CIRP, Fuerth, DE, [online], https://doi.org/10.1016/j.procir.2020.09.157, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=930013 (Accessed September 7, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 9, 2020, Updated December 16, 2021