Simultaneous Imaging and Precision Alignment of Two mm Wave Antennas Based on Polarization-Selective Machine-Vision
Joshua A. Gordon, David R. Novotny
In this paper, we present an optical imaging tool, the Overlay Imaging Aligner (OIA), developed to aid in the mechanical alignment of antenna components in the mm-wave and low-THz frequency regimes (50500 GHz) where the millimeter and sub millimeter wavelengths pose significant alignment challenges. The OIA uses a polarization-selective machine-vision approach to generate two simultaneous and overlaid real-time digital images along a common axis; this allows for aligning two antenna components to within fractions of a wavelength in the mm-wave and THz frequency regimes. The overall concept, optical design, function, performance characteristics and application examples are presented. A quantitative assessment of the alignment accuracy achievable with the OIA at specific frequencies in the WR-2.2 band is made where the alignment achieved with the OIA is compared to an electrical alignment.
IEEE Transactions on Microwave Theory and Techniques
and Novotny, D.
Simultaneous Imaging and Precision Alignment of Two mm Wave Antennas Based on Polarization-Selective Machine-Vision, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/TIM.2012.2202190
(Accessed December 8, 2023)