Gordon, J.
and Novotny, D.
(2012),
Simultaneous Imaging and Precision Alignment of Two mm Wave Antennas Based on Polarization-Selective Machine-Vision, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/TIM.2012.2202190
(Accessed December 14, 2024)
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Simultaneous Imaging and Precision Alignment of Two mm Wave Antennas Based on Polarization-Selective Machine-Vision
Published
Author(s)
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Abstract
In this paper, we present an optical imaging tool, the Overlay Imaging Aligner (OIA), developed to aid in the mechanical alignment of antenna components in the mm-wave and low-THz frequency regimes (50500 GHz) where the millimeter and sub millimeter wavelengths pose significant alignment challenges. The OIA uses a polarization-selective machine-vision approach to generate two simultaneous and overlaid real-time digital images along a common axis; this allows for aligning two antenna components to within fractions of a wavelength in the mm-wave and THz frequency regimes. The overall concept, optical design, function, performance characteristics and application examples are presented. A quantitative assessment of the alignment accuracy achievable with the OIA at specific frequencies in the WR-2.2 band is made where the alignment achieved with the OIA is compared to an electrical alignment.Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
61
Issue
11
Pub Type
Journals
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Keywords
alignment, antenna, machine vision, millimeter wave, terahertz, waveguide
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Created November 1, 2012, Updated November 10, 2018