This paper describes a simulation program that was developed to compare the uncertainties that would be expected with different measurement strategies for the noise parameters of connectorized amplifiers and of amplifiers or transistors on wafers. Both type A and type B uncertainties are included. An illustrative example is given.
Proceedings Title: CPEM 2010: Conference on Precision Electromagnetics Measurement 2010
Conference Dates: June 13-18, 2010
Conference Location: Daejeon, -1
Conference Title: CPEM CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS
Pub Type: Conferences
amplifier noise, measurement uncertainty, noise measurement, noise parameters, transistor noise