SEM/X-Ray Imaging of Cement-Based Materials

Published

August 1, 1999

Author(s)

Dale P. Bentz, Paul E. Stutzman, C Haecker, S Remond

Abstract

Scanning electron microscopy and X-ray imaging techniques have been developed for imaging the complex microstructure of cement-based materials such as cement powder and fly ash. By combining the information available in the backscattered electron and relevant X-ray images, an accurate segmentation of the image into individual cement clinker phases or other components can be accomplished. This paper reviews the image acquisition and processing techniques used in performing this analysis, as well as the statistics that can be used to characterize the final 2-D microstructures, such as area fractions, surface fractions, and correlation functions. In addition, two applications are presented: 1) the imaging of a series of fly ashes from different sources, and 2) the analysis of cement microstructure as a function of grinding fineness. The resultant images provide the quantitative characterization needed for input into three-dimensional computer models of cement hydration and microstructural development.

Proceedings Title

Proceedings of the 7th Euroseminar on Microscopy Applied to Building Materials

Conference Dates

June 29-July 2, 1999

Conference Location

Delft, NL

Conference Title

Euroseminar on Microscopy Applied to Building Materials

Pub Type

Conferences

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Keywords

building technology, correlation, image analysis, microstructure, scanning electron microscopy, segmentation, x-ray imaging

Citation

Bentz, D. , Stutzman, P. , Haecker, C. and Remond, S. (1999), SEM/X-Ray Imaging of Cement-Based Materials, Proceedings of the 7th Euroseminar on Microscopy Applied to Building Materials, Delft, NL, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=861061 (Accessed October 9, 2025)