Oettinger, F.
and Blackburn, D.
(1990),
Semiconductor Measurement Technology: Thermal Resistance Measurements, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed January 23, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Semiconductor Measurement Technology: Thermal Resistance Measurements
Published
Author(s)
,
Citation
Special Publication (NIST SP) -
Volume
400
Issue
86
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 30, 1990, Updated October 12, 2021