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Semiconductor Measurement Technology: Thermal Resistance Measurements

Published

Author(s)

Frank F. Oettinger, David L. Blackburn
Citation
Special Publication (NIST SP) -
Volume
400
Issue
86

Citation

Oettinger, F. and Blackburn, D. (1990), Semiconductor Measurement Technology: Thermal Resistance Measurements, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD (Accessed May 19, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 30, 1990, Updated October 12, 2021