Marchiando, J.
(1989),
Semiconductor Measurement Technology: A Software Program for Aiding the Analysis of Ellipsometric Measurements, Simple Models, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed September 17, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Semiconductor Measurement Technology: A Software Program for Aiding the Analysis of Ellipsometric Measurements, Simple Models
Published
Author(s)
Citation
Special Publication (NIST SP) -
Volume
400
Issue
83
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 1, 1989, Updated February 17, 2017