Marchiando, J.
(1989),
Semiconductor Measurement Technology: A Software Program for Aiding the Analysis of Ellipsometric Measurements, Simple Models, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD (Accessed May 10, 2026)
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Semiconductor Measurement Technology: A Software Program for Aiding the Analysis of Ellipsometric Measurements, Simple Models
Published
Author(s)
Citation
Special Publication (NIST SP) -
Volume
400
Issue
83
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created July 1, 1989, Updated February 17, 2017