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Semiconductor Measurement Technology: INSTANT - IGBT Network Simulation and Transient ANalysis Tool

Published

Author(s)

Allen R. Hefner Jr.
Citation
Special Publication (NIST SP) -
Volume
400
Issue
88

Citation

Hefner, A. (1992), Semiconductor Measurement Technology: INSTANT - IGBT Network Simulation and Transient ANalysis Tool, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD (Accessed June 15, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 1, 1992, Updated February 17, 2017