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Semiconductor Measurement Technology: EPROP: An Interactive FORTRAN Program for Computing Selected Electronic Properties of Gallium Arsenide and Silicon

Published

Author(s)

A. C. Seabaugh, J. J. Mathias, M I. Bell
Citation
Special Publication (NIST SP) -
Volume
400
Issue
85

Citation

Seabaugh, A. , Mathias, J. and Bell, M. (1990), Semiconductor Measurement Technology: EPROP: An Interactive FORTRAN Program for Computing Selected Electronic Properties of Gallium Arsenide and Silicon, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD (Accessed October 9, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 30, 1990, Updated October 12, 2021