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Semiconductor Measurement Technology: EPROP: An Interactive FORTRAN Program for Computing Selected Electronic Properties of Gallium Arsenide and Silicon

Published

Author(s)

A. C. Seabaugh, J. J. Mathias, M I. Bell
Citation
Special Publication (NIST SP) -
Volume
400
Issue
85

Citation

Seabaugh, A. , Mathias, J. and Bell, M. (1990), Semiconductor Measurement Technology: EPROP: An Interactive FORTRAN Program for Computing Selected Electronic Properties of Gallium Arsenide and Silicon, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD (Accessed May 3, 2024)
Created April 30, 1990, Updated October 12, 2021