Cassard, J.
and Zaghloul, M.
(1994),
Semiconductor Measurement Technology: Design and Testing Guides for the CMOS and Lateral Bipolar-on-SOI Test Library, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed October 10, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Semiconductor Measurement Technology: Design and Testing Guides for the CMOS and Lateral Bipolar-on-SOI Test Library
Published
Author(s)
,
Citation
Special Publication (NIST SP) -
Volume
400
Issue
93
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created February 28, 1994, Updated October 12, 2021