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Semiconductor Measurement Technology: Design and Testing Guides for the CMOS and Lateral Bipolar-on-SOI Test Library

Published

Author(s)

Janet M. Cassard, Mona E. Zaghloul
Citation
Special Publication (NIST SP) -
Volume
400
Issue
93

Citation

Cassard, J. and Zaghloul, M. (1994), Semiconductor Measurement Technology: Design and Testing Guides for the CMOS and Lateral Bipolar-on-SOI Test Library, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD (Accessed May 26, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 28, 1994, Updated October 12, 2021