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Search Publications by: Aaron Chew (Fed)

Displaying 1 - 2 of 2

Ellipsometry in the EUV Regime

April 24, 2025

Author(s)

Aaron Chew, Bryan Barnes, Eric Shirley, Thomas Germer

We propose and analyze the sensitivity of an ellipsometer that uses extreme ultraviolet (EUV) light from the synchrotron SURF-III. The ellipsometer employs a four-mirror geometry to control polarization, as documented in the associated patent. With a

Lab-based multi-wavelength EUV diffractometry for critical dimension metrology

April 24, 2025

Author(s)

Bryan Barnes, Aaron Chew, Nicholas Jenkins, Yunzhe Shao, Martin Sohn, Regis Kline, Daniel Sunday, Purnima Balakrishnan, Thomas Germer, Steven Grantham, Clay Klein, Stephanie Moffitt, Eric Shirley, Henry Kapteyn, MARGARET MURNANE

Background: The industry is developing extreme-ultraviolet wavelength (EUV) techniques to measure critical dimensions (CDs) in logic fabrication. As nascent approaches are unveiled, evaluations against reference metrologies are essential to motivate

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