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Search Publications by: Edwin Supple (Fed)

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Measuring Dislocation Line Charge in GaN using Scanning Precession Electron Diffraction

July 26, 2025

Author(s)

Edwin Supple, Kristine Bertness, Matthew Brubaker, Alexana Roshko

Dislocations in GaN have been known for some time to accumulate line charge along their length, affecting the electrical and optical properties of the material: increasing leakage current, inducing premature breakdown, and reducing carrier mobility [1]

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