March 13, 2025
Author(s)
Mingxin Lei, Stephen Eckel, Eric Norrgard, Nikunjkumar Prajapati, Alexandra Artusio-Glimpse, Matthew Simons, Christopher Holloway
Electrometry based on electromagnetically induced transparency (EIT) in alkali Rydberg vapor cells may suffer reduced sensitivity due to spurious line broadening effects, caused by surface charges, contaminant gases, or other manufacturing defects. In