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Search Publications by: Theodore C. Stauffer (Fed)

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Displaying 26 - 50 of 68

Delamination strength of YBCO coated conductors under transverse tensile stress

June 21, 2007
Author(s)
Daniel C. van der Laan, John (Jack) W. Ekin, Cameron C. Clickner, Theodore C. Stauffer
We present a new experimental technique to measure the delamination strength under transverse tensile stress of YBa 2Cu 3O 7-δ coated conductors for electric power applications. The delamination strength, defined as the tensile stress at which the ceramic

Critical-Current Measurements on ITER Nb3Sn Strands: Effect of Temperature

July 29, 2005
Author(s)
Loren F. Goodrich, Najib Cheggour, John (Jack) W. Ekin, Theodore C. Stauffer
Transport critical-current (II c) measurements were made on commercial multifilamentary Nb 3Sn strands at temperatures (T) from 4 to 17 K and magnetic fields (H) from 0 to 14 T. Samples investigated were taken from the stage 1 pre-production strand for the

Unexpected Effect of Field Angle in Magnetoresistance Measurements of High-Purity Nb

June 1, 2005
Author(s)
Loren F. Goodrich, Theodore C. Stauffer, Jolene Splett, Dominic F. Vecchia
We report on unexpected field-angle dependence of the magnetoresistance measurements of commercial, high-purity Nb discovered during our study of residual resistivity ratio ( RRR) measurements. The ( RRR) value indicates the purity and the low-temperature

Variable-Temperature Critical-Current Measurements on a Nb 3 Sn Wire

June 1, 2005
Author(s)
Loren F. Goodrich, Theodore C. Stauffer
We made variable-temperature critical-current (I c) measurements on a commercial multifilamentary Nb 3Sn wire for temperatures (T) from 4 to 17 K and magnetic fields (H) from 0 to 12 T using transport current. The sample had a diameter of 0.811 mm and a Cu

Measuring residual resistivity ratio of high-purity Nb

July 27, 2004
Author(s)
Loren F. Goodrich, Theodore C. Stauffer, Jolene Splett, Dominic F. Vecchia
We compared methods of measuring the residual resistivity ratio (RRR) of high-purity Nb using transport current. Our experimental study is intended to answer some fundamental questions about the best measurement for RRR and the biases that may exist among

Variable-temperature critical-current measurements on a Nb-Ti wire

July 27, 2004
Author(s)
Loren F. Goodrich, Theodore C. Stauffer
We made variable-temperature critical-current (I c) measurements on a commercial multifilamentary Nb-Ti wire for temperatures (T) from 4 to 9 K and magnetic fields (H) from 0 to 11.5 T using transport current. The measurements cover the whole range of

More Diamagnetism Demonstrations

February 1, 2003
Author(s)
Chris Conery, Loren F. Goodrich, Theodore C. Stauffer
The availability of very strong permanent magnets allows observation of phenomena previously difficult to see. The diamagnetism of water and diamagneticly stabilized magnetic levitation are now easy to demonstrate.

Variable mutual inductance in critical-current measurements

January 1, 2002
Author(s)
Loren F. Goodrich, Theodore C. Stauffer
We have investigated the mutual inductance observed on pairs of voltage tapes that are soldered to superconducting wires in order to measure the voltage-current (V-I) characteristics & determine the critical current. Measurements on a Nb-Ti superconductor

Hysteresis in transport critical-current measurements of oxide superconductors

May 31, 2001
Author(s)
Loren F. Goodrich, Theodore C. Stauffer
We investigated magnetic hysteresis in transport critical-current (I c) measurement of Ag-matrix (B i,Pb) 2Sr 2Ca 2Cu 3O^10-x^ *Bi-2223) and AgMg-matrix Bi 2Sr 2CaCu 2O 8+X (Bi-2212) tapes. The effect of magnetic hysteresis on the measured critical current

Hysteresis in Transport Critical-Current Measurements of Oxide Superconductors

March 1, 2001
Author(s)
Loren F. Goodrich, Theodore C. Stauffer
We have investigated magnetic hysteresis in transport critical-current (I c) measurements of Ag-matrix (Bi, Pb) 2Sr 2Ca 2Cu 3O 10-x (Bi-2223) and AgMg-matrix Bi 2Sr 2CaCu 2O 8+x (Bi-22-2212) tapes. I c hysteresis causes measurements with field, angle, and
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