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Search Publications by: Jeffrey R. Guerrieri (Fed)

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Displaying 101 - 125 of 134

Planar Near-Field Measurements Results up to 94 GHz Using Probe Position Correction

October 30, 2005
Author(s)
Jeffrey R. Guerrieri, Katherine MacReynolds, Michael H. Francis, Ronald C. Wittmann, Douglas T. Tamura
This paper presents results of planar near-field measurements at 16, 35 and 94 GHz using probe position correction algorithms. The algorithms correct for position errors of the probe near the scan plane. The probe?s actual position is measured using a

Estimating Multiple-Reflection Uncertainties in Spherical Near-Field Measurements

October 17, 2004
Author(s)
Michael H. Francis, Jeffrey R. Guerrieri, Katherine MacReynolds, Ronald C. Wittmann
We propose a method to estimate multiple-reflection effects on test-antenna pattern and gain uncertainties in the far field derived from spherical near-field measurements. To estimate these uncertainties we make a near-field measurements on two spheres

Practical Implementation of Probe-Position Correction in Near-field Planar Scanning Measurements

October 17, 2004
Author(s)
Jeffrey R. Guerrieri, Katherine MacReynolds, Michael H. Francis, Ronald C. Wittmann, Douglas T. Tamura
Planar near-field measurements require taking amplitude and phase data on an accurate and equal space grid on the plane in front of the antenna under test. The position accuracy on this grid has been determined to be '/50. As frequencies become higher

Standard Radiometers and Targets for Microwave Remote Sensing

September 24, 2004
Author(s)
James P. Randa, Amanda Cox, Dave K. Walker, Michael H. Francis, Katherine MacReynolds, Jeffrey R. Guerrieri
We describe the NIST effort to develop brightness-temperature standards for microwave and millimeter-wave frequencies. Results of preliminary measurements at 26 GHz are presented.

Methods to Estimate and Reduce Leakage Bias Errors in Planar Near-Field Measurements

November 8, 2002
Author(s)
Allen C. Newell, Jeffrey R. Guerrieri, Katherine MacReynolds
This paper describes two methods that can be used to measure the leakage signals, predict the effect on the far-field pattern and correct the measured data for leakage bias errors without additional near-field measurements. One method is an extension and