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Estimating Multiple-Reflection Uncertainties in Spherical Near-Field Measurements

Published

Author(s)

Michael H. Francis, Jeffrey R. Guerrieri, Katherine MacReynolds, Ronald C. Wittmann

Abstract

We propose a method to estimate multiple-reflection effects on test-antenna pattern and gain uncertainties in the far field derived from spherical near-field measurements. To estimate these uncertainties we make a near-field measurements on two spheres separated by λ/4. We compare this estimate to that obtained when we select several cuts (using all values of θ but only a few values of φ) from each sphere.
Proceedings Title
Proc., Antenna Meas. Tech. Asoc. Symp.
Conference Dates
October 18-21, 2004
Conference Location
Atlanta, GA, USA

Keywords

near-field measurements, spherical scanning, uncertainty.

Citation

Francis, M. , Guerrieri, J. , MacReynolds, K. and Wittmann, R. (2004), Estimating Multiple-Reflection Uncertainties in Spherical Near-Field Measurements, Proc., Antenna Meas. Tech. Asoc. Symp., Atlanta, GA, USA (Accessed July 18, 2024)

Issues

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Created October 16, 2004, Updated October 12, 2021