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Displaying 76 - 77 of 77

Fast, bias-free algorithm for tracking single particles with variable size and shape

August 26, 2008

Author(s)

Andrew J. Berglund, Matthew D. McMahon, Jabez J. McClelland, James A. Liddle

We introduce a fast and robust technique for single-particle tracking with nanometer accuracy.We extract the center-of-mass of the image of a single particle with a simple, iterative algorithm that efficiently suppresses background-induced bias in a

Modeling Particle Transport in Lithographically-Directed, Evaporation-Driven Self-Assembly Systems

January 1, 2007

Author(s)

John Dyreby, K Turner, G Nellis, James Alexander Liddle

Topographically directed, evaporation driven self-assembly (EDSA) of nanoparticles is a promising manufacturing technique that combines the control of top-down lithography with the speed of bottom-up self-assembly. , We have developed a modeling

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