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Search Publications by Savelas A. Rabb

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Displaying 1 - 25 of 28

Development of Two Fine Particulate Matter Standard Reference Materials (

Author(s)
Michele M. Schantz, Danielle Cleveland, Nathanael A. Heckert, John R. Kucklick, Stefan D. Leigh, Stephen E. Long, Jennifer M. Lynch, Karen E. Murphy, Rabia Oflaz, Adam L. Pintar, Barbara J. Porter, Savelas A. Rabb, Stacy S. Schuur, Stephen A. Wise, Rolf L. Zeisler
Two new Standard Reference Materials (SRMs), SRM 2786 Fine Particulate Matter (

An improved result on the measurement of the Avogadro constant from a 28Si crystal

Author(s)
Yasushi Azuma, G Barat, Guido Bartl, Horst Bettin, Michael Borys, I Busch, L Cibik, G D' Agostino, K Fujii, H Fujimoto, A Hioki, Michael Krumrey, U Kuetgens, N Kuramoto, Giovanni Mana, E Massa, R Meess, Shigeki Mizushima, T Narukawa, Arnold Nicolaus, Axel Pramann, Savelas A. Rabb, Olaf Rienitz, C Sasso, M Stock, Robert D. Vocke Jr., A Waseda, S Zakel
In this paper new results of an international research project aimed at determining the Avogadro constant by counting the atoms in an isotopically enriched

Certification of Three NIST Renewal Soil Standard Reference Materials® for Element Content: SRM 2709a San Joaquin Soil, SRM 2710a Montana Soil I, and SRM 2711a Montana Soil II

Author(s)
Elizabeth A. Mackey, Christopher S. Johnson, Richard M. Lindstrom, Stephen E. Long, Anthony F. Marlow, Karen E. Murphy, Rick L. Paul, Rachel S. Popelka-Filcoff, Savelas A. Rabb, John R. Sieber, Rabia Oflaz, Bryan E. Tomlin, Laura J. Wood, James H. Yen, Lee L. Yu, Rolf L. Zeisler, S. A. Wilson, M. G. Adams, Z. A. Brown, P. L. Lamothe, J. E. Taggart, C. Jones, J. Nebelsick
For the past 20 y, the National Institute of Standards and Technology has provided three soil Standard Reference Materials certified for element content: SRM

Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)

Author(s)
Ryna B. Marinenko, Shirley Turner, David S. Simons, Savelas A. Rabb, Rolf L. Zeisler, Lee L. Yu, Dale E. Newbury, Rick L. Paul, Nicholas W. Ritchie, Stefan D. Leigh, Michael R. Winchester, Lee J. Richter, Douglas C. Meier, Keana C. Scott, D Klinedinst, John A. Small
Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer