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Search Publications by: Jacob Edmond Ricker (Fed)

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Displaying 26 - 28 of 28

Picometer metrology for precise measurement of refractive index, pressure, and temperature

July 14, 2013
Author(s)
Jack A. Stone Jr., Patrick F. Egan, Jay H. Hendricks, Gregory F. Strouse, Douglas A. Olson, Jacob E. Ricker, Gregory E. Scace
For several years we have been studying the use of Fabry-Perot interferometers for precise measurement of the refractive index of gasses, where the primary motivation has been to improve interferometer-based length measurement. Because the refractive index

Faster, Better, Cheaper: New Automated Vacuum Calibration Service at NIST

October 1, 2012
Author(s)
Jacob E. Ricker, Jay H. Hendricks, Douglas A. Olson, Gregory F. Strouse
In today’s fast-paced world and ever expanding quality assurance requirements, the National Institute of Standards and Technology (NIST) has developed a system to fill the need for faster, better, and cheaper low pressure calibrations (0.65 Pa to 130 kPa)
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