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Search Publications by: Rick L. Paul (Fed)

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Displaying 76 - 100 of 155

Elemental Analysis of a Single-Walled Carbon Nanotube Candidate Reference Material

October 15, 2010
Author(s)
Rolf L. Zeisler, Rick L. Paul, Rabia Oflaz, Lee L. Yu, Jacqueline L. Mann, William R. Kelly, Brian E. Lang, Stefan D. Leigh, Jeffrey A. Fagan
A material containing single-walled carbon nanotubes (SWCNTs) together with other carbon species, cata-lyst residues, and trace element contaminants has been prepared by the National Institute of Standards and Technology for characterization and

Certification of Three NIST Renewal Soil Standard Reference Materials(R) for Element Content: SRM 2709a San Joaquin Soil, SRM 2710a Montana Soil I, and SRM 2711a Montana Soil II

June 1, 2010
Author(s)
Elizabeth A. Mackey, Christopher S. Johnson, Richard M. Lindstrom, Stephen E. Long, Anthony F. Marlow, Karen E. Murphy, Rick L. Paul, Rachel S. Popelka-Filcoff, Savelas A. Rabb, John R. Sieber, Rabia Oflaz, Bryan E. Tomlin, Laura J. Wood, James H. Yen, Lee L. Yu, Rolf L. Zeisler, S. A. Wilson, M. G. Adams, Z. A. Brown, P. L. Lamothe, J. E. Taggart, C. Jones, J. Nebelsick
For the past 20 y, the National Institute of Standards and Technology has provided three soil Standard Reference Materials certified for element content: SRM 2709 San Joaquin Soil (Baseline Trace Element Concentrations); SRM 2710 Montana Soil I (Highly

Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)

February 1, 2010
Author(s)
Ryna B. Marinenko, Shirley Turner, David S. Simons, Savelas A. Rabb, Rolf L. Zeisler, Lee L. Yu, Dale E. Newbury, Rick L. Paul, Nicholas W. Ritchie, Stefan D. Leigh, Michael R. Winchester, Lee J. Richter, Douglas C. Meier, Keana C. Scott, D Klinedinst, John A. Small
Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materials needed by the

Determination of Elements in SRM Soil 2709a by Neutron Activation Analysis

December 1, 2009
Author(s)
Rick L. Paul, Elizabeth A. Mackey, Rolf L. Zeisler, Rabia Oflaz, Bryan E. Tomlin
A combination of instrumental neutron activation analysis (INAA) and prompt gamma-ray activation analysis (PGAA) was used to value assign 35 elements in SRM soil 2709a (San Joaquin Soil). INAA with counting of short-lived radioisotopes was used for

Combinatorial Study of Thin Film Metal Hydride by Prompt Gamma Activation Analysis

June 19, 2009
Author(s)
Raymond Cao, Jason Hattrick-Simpers, Richard Bindel, Bryan E. Tomlin, Rolf L. Zeisler, Rick L. Paul, Leonid A. Bendersky, Robert G. Downing
Cold neutron prompt gamma activation analysis (PGAA) was used to determine the amount of hydrogen in thin film Mg hydrides with varying hydrogenation times. The results suggest that the hydrogenation in the Mg thin films remains unsaturated even after 48

Design of a New Instrument for Cold Neutron Prompt Gamma-Ray Activation Analysis at NIST

December 1, 2008
Author(s)
Rick L. Paul, Richard M. Lindstrom, Christoph W. Brocker, Elizabeth A. Mackey
A new instrument for cold neutron prompt gamma-ray activation analysis (CNPGAA) is being designed and constructed at the NIST Center for Neutron Research (NCNR). The new instrument is expected to have lower gamma-ray and neutron background and better

Quantification of Hydroxyl Content in Ceramic Oxides: A PGAA Study of BaTiO3

September 1, 2008
Author(s)
Rick L. Paul, Vahit Atakan, Chun-Wei Chen, Richard E. Riman
Thermo-gravimetric analysis (TGA) and Fourier Transform Infrared Spectroscopy (FTIR) techniques for water content determination were compared with a neutron characterization technique, Prompt Gamma Activation Analysis (PGAA). Residual H content of the

Development of Certified Reference Materials of Ion-Implanted Dopants in Silicon for Calibration of Secondary Ion Mass Spectrometers

January 1, 2007
Author(s)
David S. Simons, Robert G. Downing, George P. Lamaze, Richard M. Lindstrom, Robert R. Greenberg, Rick L. Paul, Susannah Schiller, William F. Guthrie
Certified reference materials have been developed for calibration of the concentrations of the most common dopants used in silicon semiconductor technology boron, arsenic, and phosphorus. These materials consist of a single dopant species that is