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Search Publications by: Wen-Li Wu (Assoc)

Displaying 376 - 386 of 386

Polymer Mobility Near the Polymer/Solid Interface

May 6, 1999

Author(s)

Eric K. Lin, Wen-Li Wu, Sushil K. Satija, R Kolb

Neutron reflectometry is used to measure polymer mobility near an attractive solid surface over distances less than the bulk polymer radius of gyration, R g. Effective diffusion coefficients, D eff, are determined from the rates of interdiffusion between

Enhanced Polymer Segment Exchange Kinetics Due to an Applied Shear Field

January 1, 1999

Author(s)

Eric K. Lin, R Kolb, Sushil K. Satija, Wen-Li Wu

Network Structure of Bimodal Epoxies - a Small Angle X-Ray Scattering Study

January 1, 1999

Author(s)

N C. BeckTan, Barry J. Bauer, J Plestil, J D. Barnes, Da-Wei Liu, L Matejka, K Dusek, Wen-Li Wu

Studies of the Polymer Thin Film Glass Transition Temperature Monitored With the Complex Viscoelastic Coefficients

December 1, 1998

Author(s)

Christopher C. White, Wen-Li Wu

In integrated circuit manufacturing, the gaps between metal lines are a critical parameter, and polymer films are being evaluated as materials to fill these thin gaps. Desire to maximize the number of elements within a given area have forced the gaps to

Characterization of Planarity of Polymer Thin Films on Rough Surfaces

July 1, 1998

Author(s)

Wen-Li Wu, William E. Wallace

Angle-dependent total reflection x-ray fluorescence (TRXF) is used to characterize the surface roughness or the extent of planarization of a thin polymer coating on a stainless steel surface with significant roughness. The objective of this work is to

A Novel Method to Determine the Mechanical Properties of Ultra-Thin Films

April 1, 1998

Author(s)

Christopher C. White, Wen-Li Wu

Recent experimental results based on x-ray reflectivity, ellipsometry and positron annihilation spectroscopy, etc. have demonstrated that physical properties of polymer films thinner than one micron may deviate significantly from the expected bulk values

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