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Search Publications by Michael R. Winchester

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Displaying 1 - 25 of 40

Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory

Author(s)
Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael S. Epstein, Margaret C. Kline, Katrice A. Lippa, Enrico Lucon, Karen W. Phinney, Maria Polakoski, Antonio M. Possolo, Katherine E. Sharpless, John R. Sieber, Blaza Toman, Michael R. Winchester, Donald A. Windover
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged

Agglomeration of Escherichia coli with positively charged nanoparticles can lead to artifacts in a standard Caenorhabditis elegans toxicity assay

Author(s)
Shannon Hanna, Antonio R. Montoro Bustos, Alexander W. Peterson, Vytautas Reipa, Leona D. Scanlan, Sanem Hosbas Coskun, Tae Joon Cho, Monique E. Johnson, Vincent A. Hackley, Bryant C. Nelson, Michael R. Winchester, John T. Elliott, Elijah J. Petersen
The increased use and incorporation of engineered nanoparticles (ENPs) in consumer products requires a robust assessment of their potential environmental

Quantification of carbon nanotubes in environmental matrices: Current capabilities, case studies, and future improvements

Author(s)
Elijah J. Petersen, D. X. Flores-Cervantes, Thomas Bucheli, Lindsay C. Elliott, Jeffrey A. Fagan, Alexander Gogos, Shannon Hanna, Antonio R. Montoro Bustos, Desiree L. Plata, Vytautas Reipa, Paul Westerhoff, Michael R. Winchester, Elisabeth Mansfield
Carbon nanotubes (CNTs) have numerous exciting potential applications approaching commercialization. As such, quantitative measurements of CNTs in key

Preparation of silver nanoparticle loaded cotton threads to facilitate measurement development for textile applications

Author(s)
Justin M. Gorham, Karen E. Murphy, Jingyu Liu, Dimitri Tselenchuk, Gheorghe NMN Stan, Thao M. Nguyen, Richard D. Holbrook, Michael R. Winchester, Robert F. Cook, Robert MacCuspie, Vincent A. Hackley
FOREWORD This NIST special publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative

Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)

Author(s)
Ryna B. Marinenko, Shirley Turner, David S. Simons, Savelas A. Rabb, Rolf L. Zeisler, Lee L. Yu, Dale E. Newbury, Rick L. Paul, Nicholas W. Ritchie, Stefan D. Leigh, Michael R. Winchester, Lee J. Richter, Douglas C. Meier, Keana C. Scott, D Klinedinst, John A. Small
Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer