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Search Publications by: N. Alan Heckert (Fed)

Displaying 101 - 102 of 102

A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications

May 15, 2001

Author(s)

Andrew L. Rukhin, Juan Soto, James R. Nechvatal, Miles E. Smid, Elaine B. Barker, Stefan D. Leigh, M Levenson, M Vangel, D L. Banks, Nathanael A. Heckert, James F. Dray Jr., S C. Vo

[Superseded by SP 800-22 Revision 1a (April 2010): http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906762] This paper discusses some aspects of selecting and testing random and pseudorandom number generators. The outputs of such generators may

Statistical Analysis of Partial Discharge Phenomena - Time of Occurrence Distributions

October 1, 1998

Author(s)

X. Han, N. Alan Heckert, James J. Filliben, Yicheng Wang

This paper presents time-of-occurrence (phase) distributions of individual pulsating partial discharges (PDs) which occur in a point-dielectric gap in air for ac voltage conditions. It is determined that the pulse phase distribution is adequately modeled

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